WATERLOO, ON (May 4, 2021)
Dr. Christopher Scott, an imaging systems design engineer at KA Imaging, will be presenting a poster entitled High Energy Micron-Scale Pixel Direct Conversion X-ray Detectors in a virtual session for the APS/CNN Users Meeting on Tuesday May 11, from 4:00-5:00 p.m.
Dr. Scott will discuss a one-megapixel X-ray imaging detector with 7.8 µm pixel dimensions and high detection efficiency for hard X-ray energies above 20 keV. The amorphous selenium/CMOS detector technology reported can address gaps in commercially available X-ray detectors that limit their usefulness for existing applications such as phase contrast tomography and high-resolution imaging of nanoscale lattice distortions in bulk crystalline materials using Bragg coherent diffraction imaging at energies higher than 50 keV. The technology will also facilitate the creation of novel beamline imaging applications at X-ray energies at or above 20 keV. A second version of KA Imaging’s BrillianSe™ has also been developed with a 16–megapixel detector.
The annual joint users meeting of the Center for Nanoscale Materials (CNM) and the co-located Advanced Photon Source (APS) will be held virtually in 2021 by Argonne National Laboratory. Anyone is welcome to register for myriad activities including technical workshops that highlight, promote, and stimulate user science; plenary sessions; poster sessions; a vendor expo; and CNM short courses.
About KA Imaging
A spin-off from the University of Waterloo, KA Imaging specializes in developing innovative X-ray imaging technologies and systems, providing solutions to the medical, veterinary, and non-destructive test industrial markets. For more information, please visit www.kaimaging.com.
Contacts:
Fernanda Fraga
Media Relations
ff****@ka*******.com
T: 226.215.9897
