Industrial X-ray Inspection for Quality Control and Non-Destructive Testing
Industrial Inspection Systems

inCiTe™ 3D X-ray Microscope
High-resolution phase contrast micro-CT for laboratory-based structural analysis.

inCiTe™ 2.0
Integrated spectral and phase contrast micro-CT for multi-material research

BrillianSe™ Detector
Direct conversion a-Se detector for high-resolution and low-flux research imaging.
Non-Destructive Inspection for Industrial Quality Control
Core Inspection Capabilities
Detect Internal Defects with High-Resolution X-ray Imaging

cracks and fractures

voids and porosity

inclusions and contaminants

delamination in composite structures

internal structural inconsistencies
Inspect Complex Structures with Micro-CT
Three-dimensional CT imaging allows non-destructive internal analysis of complex geometries.
Micro-CT inspection enables:
- internal structure visualization
- virtual cross-sectioning without cutting the part
- detection of internal manufacturing defects
- validation of additive manufacturing builds
Volumetric inspection provides deeper insight into internal component structure and manufacturing quality.
Differentiate Materials with Spectral Imaging
Capture Fine Detail with Direct Conversion Detection
Direct conversion detectors capture X-ray photons without intermediate scintillation layers, enabling improved spatial resolution and signal fidelity.
Quality Control Applications
Additive Manufacturing Inspection
Electronics and Semiconductor Inspection
High-resolution X-ray inspection enables analysis of electronic assemblies including:
- solder joint inspection
- internal PCB structures
- component integrity verification
Composite and Advanced Materials
Pharmaceutical Inspection
Battery and Energy Systems
Inspection of battery components and assemblies can benefit from non-destructive internal analysis to evaluate internal structure and detect defects within multi-layer materials.
Why Advanced X-ray Inspection Matters
Learn About System Specifications
inCiTe™ 3D X-ray Microscope
- 8 µm pixel resolution
- Large 32 mm × 32 mm field of view
- Efficient low-flux imaging
- Grating-less phase contrast implementation
inCiTe™ 2.0 3D X-ray Microscope
An advanced modular micro-CT system integrating:
- Phase contrast imaging
- Spectral multi-energy imaging
- X-ray source options up to 130 kV
- Sub-micron pixel size at maximum magnification
- Larger sample accommodation via Reveal™ flat-panel integration
BrillianSe™ Direct Conversion Detector
A 16-megapixel hybrid a-Se/CMOS detector enabling:
- 8 µm pixel dimensions
- High DQE at hard X-ray energies
- Low-flux efficiency
- Diffraction-based microstructure imaging
- Micro-nano CT applications
Discuss Your Inspection Requirements
Latest blogs
What Is Low Flux Imaging? Low flux imaging refers to imaging conditions where only a…
You can’t fix what you can’t see. As electronic devices become more compact, densely layered,…
EOD teams depend on the accuracy of explosive detection equipment for keeping high-risk areas like…