Amorphous Selenium/CMOS Technology Can Address the Shortfalls of Other Detectors
Waterloo, Ont. (June 24, 2021)
Dr. Christopher C. Scott published a new paper to the Journal of Synchrotron Radiation titled “High-energy Micrometre-scale Pixel Direct Conversion X-ray Detector,” which is available to subscribers now.
The abstract explains that the objective of this work was to fabricate and characterize a new X-ray imaging detector with micrometre-scale pixel dimensions (7.8 µm) and high detection efficiency for hard X-ray energies above 20 keV.
This amorphous selenium/CMOS detector technology can address gaps in commercially available X-ray detectors which limit their usefulness for existing synchrotron applications at energies greater than 50 keV; for example, phase contrast tomography and high-resolution imaging of nanoscale lattice distortions in bulk crystalline materials using Bragg coherent diffraction imaging. The technology will also facilitate the creation of novel synchrotron imaging applications for X-ray energies at or above 20 keV.
Chris Scott, PhD, is a Technical
Lead at KA Imaging and focuses his work on the BrillianSe™ X-ray camera and
inCiTe™ micro-CT projects. He is a Visiting Scientist at the University of
Waterloo, where he earned his Doctor of Philosophy in Electrical and Computer Engineering
and excelled in the Honours Physics co-operative program.
The July issue of JSR can be viewed by subscribers here: https://journals.iucr.org/s/issues/2021/04/00/gy5022/index.htm
